Semiconductor devices in harsh conditions / edited by kirsten Weide-Zaage and Malgorzata Chrzanowska-Jeske
Language: English Series: Devices, circuits, and systemsPublication details: Florida : CRC Press, 2017Description: xxii, 234 pages : illustrationsContent type: Text | Media type: Unmediated | Carrier type: VolumeISBN: 9781498743808Subject(s): SEMICONDUTORS--RELIABILITY | ENVIRONMENTAL TESTING | EXTREME ENVIRONMENTSLOC classification: TK 7871.85 Sem| Item type | Home library | Collection | Shelving location | Call number | Materials specified | Copy number | Status | Date due | Barcode |
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CBU-MAIN LIBRARY, KITWE. | Main Library Open Access Collection | General Stacks | TK 7871.85 Sem (Browse shelf(Opens below)) | 1 | Available | 752010 | ||
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CBU-MAIN LIBRARY, KITWE. | Main Library Open Access Collection | General Stacks | TK 7871.85 Sem (Browse shelf(Opens below)) | 2 | Available | 752011 | ||
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CBU-MPIKA LIBRARY, MPIKA CAMPUS. | Mpika Library Collection | General Stacks | TK 7871.85 Sem (Browse shelf(Opens below)) | 3 | Available | 752012 | ||
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CBU-MPIKA LIBRARY, MPIKA CAMPUS. | Mpika Library Collection | General Stacks | TK 7871.85 Sem (Browse shelf(Opens below)) | 4 | Available | 752013 |
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| TK 5105.88813 Val Microsoft Azure Compute : the definitive guide | TK 7815 Bis Electronics : a first course | TK 7871.85 Sem Semiconductor devices in harsh conditions | TK 7871.85 Sem Semiconductor devices in harsh conditions | TK 7874.53 Kum Through silicon vias : materials, models, design, and performance | TK 7874.53 Kum Through silicon vias : materials, models, design, and performance | TK 7877 Cho High-speed devices and circuits with THz applications |
Includes bibliographic references and index.

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