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Semiconductor devices in harsh conditions / edited by kirsten Weide-Zaage and Malgorzata Chrzanowska-Jeske

By: Weide-Zaage, Kirsten Contributor(s): Chrzanowska-Jeske, Malgorzata Language: English Series: Devices, circuits, and systemsPublication details: Florida : CRC Press, 2017Description: xxii, 234 pages : illustrationsContent type: Text | Media type: Unmediated | Carrier type: VolumeISBN: 9781498743808Subject(s): SEMICONDUTORS--RELIABILITY | ENVIRONMENTAL TESTING | EXTREME ENVIRONMENTSLOC classification: TK 7871.85 Sem

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Holdings
Item type	Home library	Collection	Shelving location	Call number	Copy number	Status	Barcode
MONOGRAPH	CBU-MAIN LIBRARY, KITWE.	Main Library Open Access Collection	General Stacks	TK 7871.85 Sem (Browse shelf(Opens below))	1	Available	752010
MONOGRAPH	CBU-MAIN LIBRARY, KITWE.	Main Library Open Access Collection	General Stacks	TK 7871.85 Sem (Browse shelf(Opens below))	2	Available	752011
MONOGRAPH	CBU-MPIKA LIBRARY, MPIKA CAMPUS.	Mpika Library Collection	General Stacks	TK 7871.85 Sem (Browse shelf(Opens below))	3	Available	752012
MONOGRAPH	CBU-MPIKA LIBRARY, MPIKA CAMPUS.	Mpika Library Collection	General Stacks	TK 7871.85 Sem (Browse shelf(Opens below))	4	Available	752013

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Previous	TK 7815 Att Circuits and electronics : hands-on learning with analog discovery	TK 7815 Att Circuits and electronics : hands-on learning with analog discovery	TK 7815 Att Circuits and electronics : hands-on learning with analog discovery	TK 7871.85 Sem Semiconductor devices in harsh conditions	TK 7871.85 Sem Semiconductor devices in harsh conditions	TK 7874.53 Kau Through silicon vias : materials, models, design, and performance	TK 7874.53 Kau Through silicon vias : materials, models, design, and performance	Next

Includes bibliographic references and index.

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