Ferguson, Ryan <br/><br/>
Characterisation of Silicon-Germaniun Heterostructures by Kelvin Probe Force Microscopy 

 - 2003  University of London  2003 
<br/><br/> Thesis submitted in partial fulfilment of the requirements for the degree of Doctor of Philosophy of the University of London and the Diploma of Imperial college 
<br/><br/><label>LC Class. No.: </label>THESIS/POSTGRADUATE