Weide-Zaage, Kirsten <br/><br/>
Semiconductor devices in harsh conditions 
/ edited by kirsten Weide-Zaage and Malgorzata Chrzanowska-Jeske 
 - Florida :  CRC Press,  2017 
 - xxii, 234 pages : illustrations 
 - Devices, circuits, and systems .
<br/><br/>Includes bibliographic references and index. 
<br/><br/><label>ISBN: </label>9781498743808 
<br/><br/><label>Subjects--Topical Terms: </label><br/>SEMICONDUTORS--RELIABILITY<br/>ENVIRONMENTAL TESTING<br/>EXTREME ENVIRONMENTS
<br/><br/><label>LC Class. No.: </label>TK 7871.85 Sem