Semiconductor devices in harsh conditions / edited by kirsten Weide-Zaage and Malgorzata Chrzanowska-Jeske

By: Weide-Zaage, KirstenContributor(s): Chrzanowska-Jeske, MalgorzataLanguage: English Series: Devices, circuits, and systemsPublication details: Florida : CRC Press, 2017Description: xxii, 234 pages : illustrationsContent type: Text | Media type: Unmediated | Carrier type: VolumeISBN: 9781498743808Subject(s): SEMICONDUTORS--RELIABILITY | ENVIRONMENTAL TESTING | EXTREME ENVIRONMENTSLOC classification: TK 7871.85 Sem
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Item type Home library Collection Shelving location Call number Materials specified Copy number Status Date due Barcode
MONOGRAPH MONOGRAPH CBU-MAIN LIBRARY, KITWE.
Main Library Open Access Collection General Stacks TK 7871.85 Sem (Browse shelf(Opens below)) 1 Available 752010
MONOGRAPH MONOGRAPH CBU-MAIN LIBRARY, KITWE.
Main Library Open Access Collection General Stacks TK 7871.85 Sem (Browse shelf(Opens below)) 2 Available 752011
MONOGRAPH MONOGRAPH CBU-MPIKA LIBRARY, MPIKA CAMPUS.
Mpika Library Collection General Stacks TK 7871.85 Sem (Browse shelf(Opens below)) 3 Available 752012
MONOGRAPH MONOGRAPH CBU-MPIKA LIBRARY, MPIKA CAMPUS.
Mpika Library Collection General Stacks TK 7871.85 Sem (Browse shelf(Opens below)) 4 Available 752013

Includes bibliographic references and index.

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