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Results of search for 'su:"INTEGRATED CIRCUITS--TESTING"'
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Authors
Gupta, S. (Sandeep),...
Jha, Niraj K
Jowett, C. E
Turino, Jon L
Holding libraries
CBU-MAIN LIBRARY, KITWE.
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MONOGRAPH
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DIGITAL INTEGRATED C...
INTEGRATED CIRCUITS-...
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Compatibility and testing of electronic components
by
Jowett, C. E.
Publication details:
London:
Butterworths
1972
Availability:
Items available for loan:
CBU-MAIN LIBRARY, KITWE.
(1) .
Collection(s):
Call number:
TK 7874 Jow
.
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Design to test: a definitive guide for electronic design, manufacture, and service. (2nd ed.)
by
Turino, Jon L.
Edition:
2nd ed.
Publication details:
New York:
Van Nostrand Reinhold
1990
Availability:
Items available for loan:
CBU-MAIN LIBRARY, KITWE.
(1) .
Collection(s):
Call number:
TK 7874 Tur
.
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Testing of digital systems
by
Gupta, S. (Sandeep), 1962-
|
Jha, Niraj K.
Publication details:
Cambridge:
Cambridge University Press
2003
Online access:
Click here for electornic version
|
Click here for electornic version
|
Click here for electornic version
Availability:
Items available for loan:
CBU-MAIN LIBRARY, KITWE.
(1) .
Collection(s):
Call number:
TK 7868.D5 Jha
.
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